Products and updates from CyberOptics, Hexagon, Lumetrics, Park Systems and Starrett.
CyberGage360 from CyberOptics
The CyberGage360. (Image courtesy of CyberOptics Corporation.)
CyberOptics Corporation has announced the debut of its CyberGage360, a high-precision automated 3D scanning system.
CyberGage360 is intended to facilitate quality assurance of incoming parts and in-process inspection of components on the manufacturing floor. Designed for use in general purpose metrology, the CyberGage360 has a range of potential applications, including consumer electronics, automotive and aerospace manufacturing.
The system has a cylindrical work volume with a 200 mm (8”) diameter that is 100 mm (4”) high. It incorporates two scanners, one above and one below with an accuracy of ± 25 microns.
CyberGage360 can generate a full 360-degree automated 3D scan of high-tolerance parts in less than three minutes. It incorporates CyberOptics’ proprietary 3D Multi-Reflection Suppression (MRS) technology to inhibit measurement distortions.
The system allows for factory-friendly operation with minimal training by automatically generating an inspection report with one click, including a comparison to a CAD model or ‘golden’ example.
“We just announced the start of our beta testing last month and already we are seeing interest in this technology that combines high-precision scanning accuracy with one-button ease of use, generating a full scan in just minutes,” said Dr. Subodh Kulkarni, president and CEO of CyberOptics.
CyberOptics debuted CyberGage360 at the 2016 IPC APEX EXPO at the Las Vegas Convention Center.
For more information, visit the CyberOptics website.
Hexagon Updates SENMATION
The SENMATION automated intelligent sensor system.
Hexagon Manufacturing Intelligence has added new functionality to its SENMATION universal sensor interface for Leitz PMM-C coordinate measuring machines (CMMs).
SENMATION deploys the right sensor at the right time on a single CMM for measurement applications in industries such as automotive, oil and gas and energy.
The new sensor interface enables the fully-automatic exchange of sensors within part inspection programs. The upgraded version adds the HP-S-X5 HD heavy-duty analogue scanning probe to the SENMATION toolset.
The HP-S-X5 HD accepts styli of up to 800 mm and 650 g. The update will also enable SENMATION to handle the PROFILER R tactile roughness sensor in the near future, further extending CMM functionality.
SENMATION is based on a universal sensor switch and intelligent sensor module. Integrated into the CMM quill, SENMATION uses a mechanical loading system to engage the sensor without operator intervention. A built-in probe identification system recognizes the sensor immediately and checks its status, obviating the need to recalibrate between exchanges.
The data collected by each sensor resides in the same software file, giving users a comprehensive overview of the workpiece using the best sensor available for every surface and feature.
In addition to the HP-S-X5 HD, SENMATION accepts the motorized indexing probe head HH-AS-2.5 with HP-S-X1 scanning sensor, the HP-S-X5 3D scanning probe and the PRECITEC LR optical sensor for non-contact measurements on matte, reflective, glass or transparent material.
Initially launched on the Leitz PMM-Xi, SENMATION is now also available with new orders of the Leitz PMM-C placed via local Hexagon Manufacturing Intelligence commercial operations and dealers.
For more information, visit the Hexagon Manufacturing Intelligence website.
OptiGauge LT from Lumetrics
The newest non-contact thickness measurement system from Lumetrics, the OptiGauge LT, is designed for engineers and quality control professionals seeking to integrate thickness measurement into their desktop or laptop computers.
Unlike its predecessor, the OptiGauge MLS, the new device no longer requires a dedicated OptiGauge Controller. Instead, users can connect the OptiGauge LT directly to their computers via USB.
The OptiGauge LT uses low coherence interferometry to measure up to 20 layers. It has a measurement range of 12 microns to 5 mm optical thickness with an accuracy of ± 2 microns, dependent on the refractive index of the sample material.
The OptiGauge LT is suitable for a variety of measurement applications, including:
- Medical: Balloons, catheters, tubing (wall, ID, OD)
- Glass: Automotive, float, flat, electronic display, optics (thickness, inner layers)
- Ophthalmic: Contact lenses, IOLs (CT, SAG)
- Industrial: Film, coatings, packaging, adhesives, barrier layers (thickness)
For more information, visit the Lumetrics website.
Park NX-Hivac from Park Systems
The Park NX-Hivac is a high-vacuum atomic force microscope (AFM) for failure analysis and atmosphere-sensitive materials research.
It is designed to improve sensitivity and repeatability in AFM measurements for materials science researchers and failure analysis engineers requiring high-accuracy and high-resolution measurements in a vacuum environment.
The Park NX-Hivac features a 50 µm x 50 µm XY scanner with an optional 100 µm x 100 µm upgrade.
Its inner vacuum chamber measures 300 mm x 420 mm x 320 mm and its outer vacuum (including granite and pump) measures 800 mm x 950 mm x 730 mm.
The vacuum level is typically less than 1×10-5 Torr, which the AFM reaches within five minutes of pumping.
Park System’s patented SmartScan software allows operators to perform 3D microscopy at nanoscale resolution with a point-and-click interface.
Users can conduct Scanning Spreading Resistance Microscopy (SSRM) under high-vacuum conditions, which reduces the required tip-sample interaction force, significantly reducing damage to both the sample and the tip.
This can extend the life of each tip, making scanning cheaper and more convenient, as well as providing more accurate results by improving spatial resolution and signal-to-noise ratio.
“Park NX-Hivac offers greater accuracy, better repeatability and less tip and sample damage than ambient or dry N2 conditions,” said Keibock Lee, President of Park Systems. “Our design allows users to measure a much wider range of signal responses in various failure analysis applications, such as dopant concentrations in SSRM.”
“High vacuum SSRM measurements conducted with the Park NX-Hivac guarantee failure analysis engineers substantial benefits including increased throughput and yield, cost reductions, and improved accuracy,” Lee concluded.
The AFM is being showcased at the American Physical Society (APS) March Meeting from March 14-18 2016 in Booth 917 at the Baltimore Convention Center.
For more information, visit the Park Systems website.
HB 400 from Starrett
Starrett’s HB400 horizontal benchtop optical comparator features a 16″ screen, 12″ fast traverse X-axis travel (16″ Optional) and 6” Y-axis travel.
It also offers quick-change bayonet fitting lenses and a Q-axis digital protractor with angular measurements to 1” resolution.
Purchasers can choose between Quadra-Chek or MetLogix software control systems and have the option of adding a CNC control.
The HB400 is designed for a wide range of non-contact dimensional inspection applications and complex measuring requirements. Horizontal models work well with parts that need to be fixtured, held in a vice or on centers.
For more information, visit the Starrett website.
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