Among the challenges in the design flow has been aligning the metrics for design-for-test and for functional safety. This paper describes using logic built-in-self-test as both a functional safety mechanism and as a part of in-system testing, which allows for alignment of metrics required for safety certifications.
The promise of autonomous vehicles is driving profound changes in the design and testing of automotive semiconductor parts. The ICs for safety-critical applications need to meet the ISO 26262 standard for functional safety. Among the challenges in the design flow has been aligning the metrics for design-for-test and for functional safety.
This paper describes using logic built-in-self-test as both a functional safety mechanism and as a part of in-system testing, which allows for alignment of metrics required for safety certifications.
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