Critical area analysis (CAA) can be used by both designers and foundries to directly improve the manufacturability, and ultimately the profitability, of IC designs. In this white paper we introduce the concept of defect density data for critical area analysis and how it can impact yield.
Critical area analysis (CAA) can be used by both designers and foundries to directly improve the manufacturability, and ultimately the profitability, of IC designs. In this white paper we introduce the concept of defect density data for critical area analysis and how it can impact yield.
Learn more about how to:
- Identify design geometries susceptible to random defects during manufacturing
- Adjust the manufacturing processes to reduce the occurrence of random defects for given geometries
- Generate defect density data from test chips
- Predict defect limited yield before tapeout
To download, please complete the form on this page. Your download is sponsored by Mentor, a Siemens Business.
