Parasitic Extraction of MIM/MOM Capacitor Devices in Analog/RF Designs

Understanding best practices and recommended tools for extracting the complex geometries of capacitor devices, as well as the in-context coupling effects for those devices in sensitive analog/RF blocks, enables designers to accurately apply the appropriate extraction process to different parts of the design.

The extensive use of MIM/MOM capacitors in analog/RF designs presents designers with extraction challenges that typically require multiple extraction techniques.

The Calibre xACT platform offers analog/RF designers the fast performance of a rule-based extraction engine, and the capacity and performance of a field solver, to efficiently extract all parasitic components in a timely manner, with the confidence that all parasitic effects are accurately characterized.

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