New family of PXI & PXIe simulator modules achieve rotation speeds of 130kRPM for advanced servo system testing.
Pickering Interfaces, a supplier of modular signal switching and simulation solutions for electronic test and verification, has expanded its 41-670 (PXI) and 43-670 (PXIe) LVDT, RVDT, and resolver simulator modules. The update adds high-speed resolver simulation capabilities of up to 130,000 RPM to support testing requirements in sectors such as automotive, aerospace, and defense.
High-speed resolver simulation is increasingly relevant as modern control systems in automotive, aerospace, and defense applications adopt resolvers with excitation frequencies up to 80 kHz. These higher frequencies help improve signal bandwidth, reduce noise sensitivity, and support better dynamic performance. Using lower-speed simulations during testing may reduce accuracy and overlook potential software issues.
The updated module enables the simulation of multiple resolver pole pairs. While most electromechanical resolvers have a maximum rotational speed of 20kRPM when simulating—for instance—four pole pairs, the corresponding x4 factor means this becomes 80kRPM electrical cycles to simulate.
The 41-670 (PXI) and 43-670 (PXIe) range is ideal for simulating variable differential transformers (VDT), both linear (LVDT) and rotary (RVDT) types, as well as resolvers with high-speed simulation up to 130kRPM rotation. They have two (41/43-670-303) or four (41/43-670-301) banks, each capable of simulating the output of a single 5- or 6-wire VDT or resolver, or dual 4-wire utilizing a shared excitation signal. This allows the module to simulate up to 4 channels of 5- or 6-wire or eight.
PXI high-channel density enables the testing of multiple resolver channels in a compact footprint. And with the addition of built-in relays, the 41/43-670 can also provide short or open circuits for each channel’s inputs and outputs, reducing the need for external switching for fault insertion requirements. The programmable phase delay can also be used for simulating imperfect sensors and cabling, artificially offsetting single or multiple outputs.
For more information, visit pickeringtest.com.
