Atomic force microscopy, on a chip

ICSPI’s David Morris explains how it works, and where it will be useful.

Microscopy has been the key to understanding everything from the nature of disease to the behaviour of metal alloys, and it’s used everywhere from medicine to manufacturing quality control. Optical microscopy has resolution limits that are strictly dictated by the physics of light, and even electron microscopy struggles at atomic scales. 

But there is another form called atomic force microscopy, or AFM, which can reach down to the atomic level, and deliver insights that are brought applications in science and engineering. 

Atomic force microscopes are traditionally expensive research tools. David Morris, Director of Operations with ICSPI, joins engineering.com’s Jim Anderton to discuss how a new generation of machines promises to bring them within reach of scientific and industrial users everywhere. 

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Written by

James Anderton

Jim Anderton is the Director of Content for ENGINEERING.com. Mr. Anderton was formerly editor of Canadian Metalworking Magazine and has contributed to a wide range of print and on-line publications, including Design Engineering, Canadian Plastics, Service Station and Garage Management, Autovision, and the National Post. He also brings prior industry experience in quality and part design for a Tier One automotive supplier.