EW - Testing Edition - Advantest Memory Testing, Keysight Protocol Verification & More
Vincent Charbonneau posted on August 16, 2017 |
New products from Advantest, Applied Materials, B&K Precision, Keysight & Rigol.

Advantest Wafer-Level Testing of Mixed Semiconductor Memories

(Image courtesy of Advantest.)
(Image courtesy of Advantest.)
Advantest has introduced the T5822 memory tester, designed for wafer-level testing of DRAMs, NAND devices and other non-volatile memories used throughout portable electronic devices. The T5822 is intended to provide manufacturers of multiple memory devices with cost efficiency and optimal functionality, including full test coverage of as many as 1,536 devices in parallel with data transfer rates up to 1.2 gigabits per second (Gbps).

The T5822 provides high-voltage resources such as a level driver and DC testing capability, along with an economical compact test head. It also features a memory repair analysis (MRA) capability to help users maximize their yields.

Using Advantest's FutureSuite operating system, the system is compatible with test programs for a range of memory devices. With output voltages from -10 volts to 13 volts, it features the performance to handle low-pin-count to high-pin-count devices.

Additional details are available on Advantest’s website.


AM Defect Inspection and Review Method for Advanced Chips

(Image courtesy of Applied Materials.)
(Image courtesy of Applied Materials.)
Applied Materials (AM) has announced a new approach to improve the yield of advanced chips by reviewing and inspecting them for deficiencies during the production phase. Defect reduction is an iterative process that involves detection of defects by inspection and review (I&R) tools, classification of defects, identification of the source, optimization of the process to eliminate defect formation and finally monitoring for process excursions

In a forthcoming technical paper co-written by AM and GLOBALFOUNDRIES titled “SEM Imaging and Automated Defect Analysis at Advanced Technology Nodes,” A. Jain et al. discuss a new DR-SEM approach to I&R. The paper states that, “By implementing the practice of wafer alignment to computer-aided design coordinates in the I&R loop, we found reporting defect locations this way eliminates tool/user discrepancy and facilitates robust DOI searching in much smaller FOVs.”

“Further, the implementation of Automated Defect Analysis using techniques such as see-through imaging, quantitative materials analysis and tilt imaging on select DOI subsets allows for root cause analysis and improved classification of defects.”

For more information, visit AM’s website.


B&K Precision Programmable AC Power Sources

(Image courtesy of B&K Precision.)
(Image courtesy of B&K Precision.)
B&K Precision has announced the 9830 Series of programmable, single-phase AC power sources for testing electronic devices during design, service and manufacturing. The 9830 Series – Model 9832 with AC power of 2000VA, and Model 9833 with 3000VA – are designed for R&D laboratories, service centers and manufacturing applications.

The 9832 and 9833 deliver accurate sine output with low total harmonic distortion (THD) when operating in AC output mode. Their built-in output options include sine, square, clip-sine, harmonic distortion and user-defined waveforms. They also each feature an amplifier mode with 1.2 kHz bandwidth for generating complex arbitrary waveforms.

The pair of instruments can be used to simulate power-line disturbances and worldwide power requirements. Additionally, their 12 on-screen measurements provide information about the device under test. The instruments’ AC+DC mode can be used to provide DC bias voltage and is also useful for power-line disturbance testing.

Information concerning pricing and availability can be found on B&K’s website.


Keysight Cellular and WiFi Protocol Verification

(Image courtesy of Keysight.)
(Image courtesy of Keysight.)
Keysight has unveiled the T5510S Cellular and WiFi Emulation System, a platform that functions with the combination of Keysight's UXM network emulator and the Ixia Solutions Group's Wave Test System, and that tests data traffic generation to physical transmission, layers 1 to 7.

The T5510S also includes Keysight's Test Automation Platform and ready-to-use, built-in test cases. The system features reliable capabilities for testing with the latest cellular standards (LTE/LTE-Advanced/NB-IoT/Cat-M) as well as all WiFi protocols (802.11a/b/g/n/ac) under a wide range of traffic and RF emulation conditions.

For more information, visit Keysight’s website.


Rigol Programmable DC Electronic Load

(Image courtesy of Rigol Technologies.)
(Image courtesy of Rigol Technologies.)
Rigol Technologies, Inc. has introduced the DL3000 Series of DC Electronic Loads. The DL3000 can draw max power up to 350W, 150V and 60A, providing the baseline performance required for most current mainstream designs.

The DL3000 features a 5A/us Slew Rate, 30kHz Dynamic Frequency, unique 4.3 inch TFT display as well as LAN and remote control capability. It also 4 provides four Constant Modes (Current, Voltage, Power, and Resistance) as well as four Transient Modes (Continuous Pulse, Timed Pulse, Toggle, and List) and three Applications Modes.

The DL3000's integrated Battery Test Mode allows users to complete battery discharge testing, letting them see live capacity in mAh and service time. Furthermore, the device comes with a free UltraLoad software application that allows for full instrument monitoring and control over USB or LAN, giving users more flexibility in how they set up and monitor experiments, as well as access to data for offline analysis.

Additional details and technical schematics can be located on Rigol’s website.


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